Alliance Supplies Sdn Bhd
Main Office :
No.7 & 7-1, 9 & 9-1,
Jalan PB 1B,
Taman Puncak Bertam,
75250 Melaka, Malaysia.
+606-3338889
+606-3338887
+606-3338898
+606-3338899
info@alliance-supplies.com

Branch (JB):
No. 5, Jalan Banang Satu, Taman Johor Industrial Estate, 81200 Johor Bahru, Malaysia.

Subang Warehouse:
No. 7 Jalan SS13/3E, Subang Jaya Ind. Estate, 47500 Subang Jaya, Selangor, Malaysia.

Office (Miri):
Lot 604, Ground Floor, Pelita Commercial Centre, Jalan Miri-Pujut, 98000 Miri, Sarawak, Malaysia.

Opening Hours:
8.30a.m - 6.00p.m
Monday - Friday

PROCEQ Equotip 550 Portable Hardness Tester - Leeb / Rockwell / UCI

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PROCEQ Equotip 550 Portable Hardness Tester - Leeb / Rockwell / UCI 4.01 Portable Hardness Tester 04.PROCEQ


 
DOWNLOADS (DOCUMENTS)

MODELS
Description Versatile Leeb hardness tester for on-site testing of heavy,
large or installed parts. Rugged touchscreen designed to provide
an exceptional user experience and best possible measuring and analysis.
Enhanced software features and analysis functions.
Equotip 540 for regular basic usage without extensive reporting needs.
Benefits
  • Use full Leeb probe portfolio and combine with Portable Rockwell and UCI
  • Comes with the high accuracy known for all Equotip  products 
  • Ready-to-go reports through powerful built-in reporting feature 
Native Scale HL
Available Probes Leeb D / DC / DL / S / E / G / C 
Combination with other methods Portable Rockwell, UCI
Average Roughness (μm / μinch) 7 / 275
Minimum Mass (kg / lbs) 0.02 / 0.045 (Leeb C)
Minimum Thickness (mm / inch) 1 / 0.04 (Leeb C)

APPLICATIONS
Standard to Large Objects Yes
Round Objects In combination with support rings
Light Objects (<2kg) With Impact device Leeb C
Very Hard Objects With Impact Device Leeb S and E
Cast Objects With Impact Leeb G and D
Polished Objects With Impact Device Leeb C
Limited Accessibility With impact devices Leeb DC and DL
Thin Objects (<5mm) No
Heat Treated Surfaces Yes

FEATURES
Instrument Firmware
  • Automatic compensation for impact direction
  • Personalized user profiles and views
  • Integrated enviroments (incl. remote control)
  • 11 Languages and timezone supported
PC Software Equotip Link allowing direct reporting and custom reports
Display 7' color rugged touchscreen unit (800 x 480 pixels) with dual core processor
Memory Internal 8 GB flash memory (>1'000'000 measurements)
Connections USB host / device and Ethernet
Measuring Range 150 - 950 HL
Measuring Accuracy ±4 HL (0.5% at 800 HL)

STANDARDIZATION
Standards
  • ASTM E 140
  • ASTM A 370
  • ISO 16859
  • DIN 50156
  • GB/T 17394
  • JB/T 9378
Guidelines
  • ASME CRTD-91
  • DGZfP Guideline MC 1
  • VDI / VDE Guideline 2616 Paper 1
  • Nordtest Technical Reports 424-1. 424-2, 424-3

ACCESSORIES
Measurement Accessories
  • Equotip Leeb Impact Device D (356 00 100)
  • Equptip Leeb Impact Device E (356 00 400)
  • Equotip Leeb Impact Device G (356 00 300)
  • Set of support rings 12 pcs for D/DC/C/E/S (353 03 000)
  • Battery Complete (327 01 033)
  • Quick Charger (external) (327 01 053)
  • 2-in-1 Kits Special Offers: Equotip 550 Portable Rockwell &
    Leeb D Kit (356 10 021), Equotip 550 Leeb D & UCI Kit (356 10 022) 
Verification Tools
  • Equotip Test Block E, ~810 HLE / ~63 HRC (357 14 400)
  • Equotip Test Block G, ~570 HLG / ~340 HB (357 32 300)
  • Equotip Test Block D/DC, ~775 HLD / ~56 HRC (357 13 100)

 
Wide Application Range

Oil & Gas
Weld, Base Material & HAZ
Pressure Vessels
Flanges
Pipes
Wellhead Equipment
 
Steel Working
Roll Testing
Coils
Heat Treatment / Casting
Wires
 

Automotive
Engine Blocks
Shafts
Panels
Gears
Brake Systems
 
Aerospace
Turbine Blades
Casings / Housings
Panels
Cast Objects
Landing Gears



356 10 001 Equotip 550 - For flexible probe configuration and for existing owners of Equotip and Equostat 3 Probes
356 10 002 Equotip 550 Leeb D - Additionally includes Equotip Leeb Impact Device D, Impact Device Cable, Test Block ~ 775 HLD / ~56 HRC, Coupling Paste, Cleaning Brush
356 10 003 Equotip 550 Leeb G - Additionally includes Equotip Leeb Impact Device G, Impact Device Cable, Test Block ~570G HLG / ~340HB, Coupling Paste, Cleaning Brush
356 10 004 Equotip 550 Portable Rockwell - Additionally includes Equotip Portable Rockwell Probe 50N, Protective Rubber Sleeve, Probe Cable, Test Block~62HRC
356 10 007 Equotip 550 UCI HV1 - HV10 Additionally includes Equotip UCI Probe HV1 - HV10, UCI Probe Cable, UCI Test Block ~850HV
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